VLSI or Very Large Scale Integration has emerged as a crucial field in electronics engineering over the past few years. With the manufacture of complex integrated circuits (ICs) with millions of ...

The cost of testing complex system-on-chip designs will soon surpass the cost of manufacturing them. Clearly this is an unstable situation. It is simply too hard to keep up with Moore's Law. While the ...

Return to original Test Digest book review. VLSI Test Principles and Architectures: Design for Testability, Laung-Terng Wang, Chen-Wen Wu, and Xiaoquing Wen (editors), Elsevier Science ...

Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...

During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...

Description: Discusses different aspects of VLSI testing and formal verification of designs. Design and manufacturing defect models are introduced along with test generation and fault simulation ...

Weakness in the semiconductor industry pushed sales of IC wafer testing probe cards down to half of the five-year historic average, or 13.9%, in 2007 according to Santa Clara, Calif.-based market ...

Every day, new methods are being developed to harvest, cleanse, integrate, and analyze data sources and extract from them useful, actionable intelligence to aid decision-making and other processes.

This link below contains information about the Cadence design tools used extensively in classes in the Electrical and Computer Engineering Department at UMass Lowell. Students obtain practical ...