From materials science to biological research, scientists have embraced Kelvin Probe Force Microscopy (KPFM) for measuring the likes of surface potential and work functions. KPFM reproduces the ...
Numerous measurement modes have been advanced to characterize mechanical, magnetic, electrical and thermal properties since Atomic Force Microscopy (AFM) was first developed [1]. Kelvin Probe Force ...
Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...
New hybrid nano-microscope by KRISS allows simultaneous measurement of optical and electrical properties. Expected to accelerate nano-scale research on advanced equipment and materials such as bilayer ...
In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...
(Nanowerk Spotlight) In their pursuit of device miniaturization, researchers are exploring the untapped potential of two-dimensional materials. These atomically thin crystals, with their unique ...
Scanning probe microscopes produce images based not on light, but on electron density and charge. Scientists are producing incredible images of tinyness heretofore visible only by means of an artist's ...
(Nanowerk News) The Korea Research Institute of Standards and Science (KRISS) has developed a hybrid nano-microscope capable of simultaneously measuring various nanomaterial properties. This ...
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