Numerous measurement modes have been advanced to characterize mechanical, magnetic, electrical and thermal properties since Atomic Force Microscopy (AFM) was first developed [1]. Kelvin Probe Force ...
The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...
Piezoresponse force microscopy (PFM) is an effective method for examining ferroelectric materials due to its nanometer-level resolution and high sensitivity, inherited from atomic force microscopy ...
In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...
New hybrid nano-microscope by KRISS allows simultaneous measurement of optical and electrical properties. Expected to accelerate nano-scale research on advanced equipment and materials such as bilayer ...
The demand for energy is ever-increasing across various industries. In recent decades, scientists have explored the electrostatic potential of ...
(Nanowerk News) The Korea Research Institute of Standards and Science (KRISS) has developed a hybrid nano-microscope capable of simultaneously measuring various nanomaterial properties. This ...
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