Particle size specification for process chemicals is an important quality control measure for the semiconductor industry. Cutting-edge microelectronics producers need ultra-clean process chemicals ...

This paper describes the development of a novel non-invasive sampling and analysis method that can be used to assess the presence of volatile pesticides on objects held in heritage collections. Vapour ...

Refineries need to conform to the newly updated US federal regulation CFR 40. To facilitate this process, US EPA Method 325 has been developed that stipulates tracking of volatile organic compounds ...